Testing & Qualification Reports
Detailed test reports and qualification data including power cycling, thermal cycling, and reliability analysis for critical applications using CRRC Times Electric power semiconductors.
🔄 Power Cycling Tests
Comprehensive power cycling test results demonstrating module lifetime under real operating conditions.
- IGBT Power Cycling: >100,000 cycles at ΔTj=80K
- SiC Power Cycling: >500,000 cycles at ΔTj=100K
- Accelerated Testing: High temperature and current stress
- Failure Analysis: Bond wire fatigue and solder layer assessment
🌡️ Thermal Cycling Tests
Temperature cycling qualification results for automotive and industrial grade modules.
- Automotive Grade: -40°C to +150°C, 1000+ cycles
- Industrial Grade: -25°C to +125°C, 500+ cycles
- Package Integrity: Thermal expansion stress analysis
- Long-term Reliability: Parameter drift monitoring
🔥 High Temperature Storage & Operation
Extended high temperature testing for mission-critical applications.
- HTOL Testing: 1000+ hours at 150°C with bias
- Storage Life: 2000+ hours at 175°C no bias
- Parameter Stability: VCEsat, VGEth, leakage current
- Humidity Testing: 85°C/85%RH environmental stress
✅ Standards Compliance Testing
Certification test results according to international standards and automotive requirements.
- IEC Standards: IEC 60747, IEC 62109 compliance
- JEDEC Standards: JESD22 qualification methods
- AEC-Q101: Automotive qualification for discrete semiconductors
- ISO Standards: ISO 9001, IATF 16949 quality systems
Featured Test Reports
T-IGBT-H3300 Power Cycling
Rail Traction IGBT Module - 3.3kV/1200A power cycling test results
- Test Conditions: ΔTj=80K, Ton=2s, Toff=2s
- Cycles Achieved: >150,000 cycles
- Failure Mode: Bond wire lift-off
- Test Standard: IEC 60747-9
T-SiC-M1200 Reliability Analysis
Automotive SiC Module - Comprehensive qualification test results
- Power Cycling: >500,000 cycles at ΔTj=100K
- Thermal Cycling: >1000 cycles, -40°C to 150°C
- HTOL: 1000h at 150°C with VDS bias
- AEC-Q101 Qualified
Grid-Scale IGBT Reliability
T-IGBT-G6500 Series - High-voltage grid infrastructure testing
- Voltage: 6.5kV blocking capability verified
- Current: 600A continuous operation tested
- Lifetime: >20 years projected operation
- Grid Code Compliance: IEEE 1547
Test Methods & Standards
International Standards Compliance
| Standard | Application |
|---|---|
| IEC 60747-9 | IGBT power cycling test methods |
| IEC 62109 | Power electronics for photovoltaic systems |
| JEDEC JESD22 | Reliability test methods for semiconductors |
| AEC-Q101 | Automotive discrete semiconductor qualification |
Test Equipment & Capabilities
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Power Cycling Test System
Automated testing up to 10kV/3kA with precise thermal control -
Thermal Cycling Chamber
Temperature range: -65°C to +200°C with controlled ramp rates -
High Temperature Test
Long-term aging ovens with bias capability up to 200°C -
Environmental Testing
Humidity, salt spray, vibration, and shock test capabilities
Custom Testing & Qualification Services
Need specific test data for your application? Our test laboratory can provide custom qualification testing and detailed failure analysis reports for your specific operating conditions.